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2014 E.J. McCluskey Doctoral Thesis Award Semifinals

October 17, 2014

May 28, 2014, Paderborn, Germany

Named after Prof. E.J. McCluskey, a key contributor to the field of test technology, the 2014 TTTC’s Doctoral Thesis Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. TTTC’s E.J. McCluskey Best Doctoral Thesis Award will be given to the winning student of the doctoral student contest and his or her advisor.

The contest is held in two stages: semi-finals and finals. In 2014, semi-finals will be held at the IEEE VLSI Test Symposium (VTS), the IEEE European Test Symposium (ETS) and the IEEE Latin American Test Workshop (LATW). At each semi-final, a jury composed of industrial and academic experts will determine the winner, and the three winners will compete against each other in the finals, held at the International Test Conference (ITC) 2014.

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